- All sections
- H - Electricity
- H01J - Electric discharge tubes or discharge lamps
- H01J 37/256 - Tubes for spot-analysing by electron or ion beams; Microanalysers using scanning beams
Patent holdings for IPC class H01J 37/256
Total number of patents in this class: 77
10-year publication summary
|
4
|
0
|
3
|
4
|
1
|
3
|
4
|
1
|
1
|
0
|
| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Hitachi High-Tech Corporation | 4424 |
12 |
| FEI Company | 851 |
9 |
| Bruker Nano GmbH | 63 |
4 |
| Applied Materials Israel, Ltd. | 549 |
3 |
| Axcelis Technologies, Inc. | 429 |
3 |
| KLA-Tencor Corporation | 2574 |
3 |
| Centre National de La Recherche Scientifique | 9632 |
2 |
| Applied Materials, Inc. | 16587 |
2 |
| Fibics Incorporated | 23 |
2 |
| Gatan, Inc. | 111 |
2 |
| University of Connecticut | 790 |
2 |
| Hitachi, Ltd. | 16452 |
1 |
| Varian Semiconductor Equipment Associates, Inc. | 1282 |
1 |
| Massachusetts Institute of Technology | 9795 |
1 |
| President and Fellows of Harvard College | 5792 |
1 |
| Carl Zeiss SMT GmbH | 2646 |
1 |
| Arkema Inc. | 1075 |
1 |
| Carl Zeiss Microscopy, LLC | 30 |
1 |
| Carl Zeiss NTS GmbH | 33 |
1 |
| Carl Zeiss NTS, LLC | 27 |
1 |
| Other owners | 24 |